Scanning Electron Microscopes (SEM) and Focused Ion Beam FIB-SEM

With over 3000 SEM’s all over the world, TESCAN is a leading global designer and manufacturer of scanning electron microscopes (SEM) and system solutions for different applications.

With a wide product range, TESCAN builds SEMs for any application need, from Tungsten Filament microscopes to high-resolution field emission SEMs and Focused Ion Beam SEM.

Visit our Tescan SEM’s page to find out more.

מיקרוסקופ אלקטרונים סורק SEM נכנס לשימוש שגרתי בתעשייה

מזעורן של מערכות, דרישות טיב חומר משופר, ותחרות הולכת וגוברת, מאלצת את היצרנים בכל המגזרים לשפר את יכולתם לראות בהגדלות שמעבר למיקרוסקופים האופטיים שברשותם.
החדשות הטובות הן שמחירם של המיקרוסקופים האלקטרונים הנדרשים לשם כך מפתיעים לטובה! המשך..

Complete solution for ELECTRON BEAM LITHOGRAPHY

TESCAN, the innovative Scanning Electron Microscope manufacturer also offers complete instrument solutions for Electron Beam Lithography. EBL has long been established as the premier technique for creating structures at the nanoscale as it allows creation of very small structures on the photo resist. This method was developed for manufacturing integrated circuits, spintronics and optoelectronics structures etc. by controling the beam generated inside the SEM column. TESCAN delivers extraordinary lithographic performance on its own high performance SEM, the combination of which ensures first class performance due to full integration with hardware. As typical for all TESCAN products, the TESCAN EBL PACKAGE provides the best price performance ratio when compared to competitors´ solutions. Read more…

TOF-SIMS with access to all features of the FIB unique integration of othogonal TOF-SIMS by Tofwerk company and FIB-SEM by TESCAN

A novel, orthogonal extraction, medium mass resolution Time-of-Flight mass spectrometer (TOF-SIMS) provides a costeffective upgrade to dual focused ion and electron beam instruments (FIB-SEM) to allow SIMS chemical mapping. Depth profiling with a resolution of a few nanometers is a matter of course, and so full three-dimensional chemical mapping with nanometer resolution can be obtained. Read more…

World’s first fully-integrated Scanning Electron Microscope and Raman Imaging.

RISE Microscopy is a novel correlative microscopy technique that combines SEM and confocal Raman Imaging. Through Raman Imaging and Scanning Electron Microscopy ultra-structural surface properties can be linked to molecular compound information. Read more..

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Scanning Electron Microscopes (SEM) and Focused Ion Beam FIB-SEM

XEIA

GAIA

FERA

LYRA FIB-FESEM

Q-PHASE

TIMA

Accessories

MAIA

MIRA

VEGA

Used and Upgraded SEMs

Special products

Software