PicoTech offers advanced wafer probing stations for the electrical measurements and test of semiconductor integrated circuits on full wafers and single dies, manufactured by Cascade Microtech. In addition our portfolio covers a variety of solutions for Reliability Testing. Manual, Semi-Automatic and Automatic tools are available to support the most challenging and state of the art applications in a variety of environments such as Cryo, vacuum, pressure..
Device Characterization
IV/CV
Flicker Noise
RF
mmW
Impedance
High Power
High Current
High Voltage
Failure Analysis
Design Debug
Emission Analysis
Laser Cutting
MEMS
Pressure Sensors
Microbolometers
RF-Mems
Optoelectronics
LED
Laser Diods
IR FPA
Image Sensors
Photo Diodes
Application-Focused Manual Probe Stations: Ideal for R&D and Academies
DC parametric and low-noise measurements
The EPS150COAX and EPS150TRIAX are dedicated probing solutions that come with everything you need to achieve accurate measurement results in the shortest time, with maximum confidence. The EPS150COAX incorporates best known methods for DC parametric test at pA levels. The EPS150TRIAX a dedicated probing solution for low-noise I-V/C-V measurements at fA levels.
Precision RF measurement results and calibrations up to 67 GHz
The EPS150RF is a dedicated probing solution that comes with everything you need to achieve accurate measurement results in the shortest time, with maximum confidence. The system incorporates best-known methods for RF probing up to 67 GHz, with the ability to probe pads as small as 25 μm x 35 μm and beyond.
Millimeter-Wave, sub-THz and load pull measurements above 67GHz and beyond.
The EPS150MMW is a dedicated probing solution that comes with everything you need to achieve accurate measurement results in the shortest time, with maximum confidence. The system incorporates best-known methods for probing up to THz frequencies.
Internal node probing down to submicron level
The EPS150FA is a dedicated probing solution that comes with everything you need to achieve accurate measurement results in the shortest time, with maximum confidence. The system incorporates best-known methods for electrical failure verification, localization and debug with the ability to probe features smaller than 1 μm
