PicoTech offers WT-2000 Versatile Platform by Semilab for Mapping of Resistance, Carrier Lifetime, Diffusion length and other parameters.
The WT-2000 is a powerful tabletop measurement platform for performing many different semiconductor material characterization measurements. The base system includes all the overhead functions necessary to perform characterization measurements. It is typically used to make maps, where the wafer is scanned at a programmable raster. The WT-2000 can also perform measurements at specific, programmable measurement locations.
Measurement capabilities:
- µ-PCD for measuring carrier lifetime
- SPV for measuring diffusion length
- JPV for measuring ion implants
- SHR / sheet resistance
- Eddy current measurement of sheet resistance
- VQ for oxide monitoring
- LBIC / photovoltaic response, quantum efficiency, diffusion length
