Ultra-High Resolution SEM (UHR SEM)

PicoTech offers Ultra-High Resolution Scanning Electron Microscopes (UHR SEM) by TESCAN.

UHR SEM for nanomaterials characterization at sub-nanometer scale:

• High-resolution and high-contrast imaging of NextGen materials (e.g. catalyst structures, nanotubes, nanoparticles and other nanoscale structures)

• Excellent platform suitable for SEM/STEM metrology at sub-nanometer scale

• Fast setup of the electron beam – optimal imaging conditions are guaranteed by the In-Flight Beam Tracing™

• Multi-detector system TriBE™ and TriSE™ for sample nano characterization

• Intuitive software modular platform designed for effortless operation regardless users’ skill level