FormFactor Probe Stations
Wide Installed Base in Israel!
FormFactor Probe Stations, Probes and Accessories
PicoTech offers a full range of Probe Stations by FormFactor including manual, semi-automatic and fully automatic probestations for 150mm, 200mm and 300mm wafers.
Probe Stations can be supplied with probes, special software and accessories for all types of athmospheric, vacuum, pressure, cryo DC and RF measurements in the area of semiconductors R&D and high-volume manufacturing.
אודות החברה
פיקוטק היא חברת הנציגויות המובילה בתחום הציוד לתהליכי ייצור למוליכים למחצה, ננו-פבריקציה, מיקרוסקופיה אלקטרונית והרכבות מדוייקות. החברה מאופיינת בצוות מהנדסים מקצועי בעל ידע וניסיון רחבים, המתמחים במתן ייעוץ לפני רכישה ובליווי אחריה. בין לקוחותיה נמנים המפעלים הגדולים בארץ לייצור שבבים, חברות הזנק, חברות הרכבות אלקטרוניות, וכל מכוני המיקרו-אלקטרוניקה והננו-פבריקציה של האוניברסיטאות בישראל
Systems In Israel
In Semiconductors
In Israel
in Service in Israel
Manual, Semi-Automatic and Fully Automatic Probe Stations
PicoTech offers a full range of Probe Stations by FormFactor including manual, semi-automatic and fully automatic probestations for 150mm, 200mm and 300mm wafers.
Probe Stations can be supplied with probes, probe cards, special software and accessories for all types of athmospheric, vacuum, pressure, cryo DC and RF measurements in the area of semiconductors R&D and high-volume manufacturing.
Visit our APPLICATION PAGE to find out more. Also on VIDEO.
MPS 150 Probe Station
FormFactor introduces a new modular concept for its best-in-class 150 mm probe stations. MPS150 is the most versatile platform for R&D, allowing to work with wafers up to 150mm.
This will make it even easier to configure your individual probe solution for current and future needs. Simply choose a base station and add as many application-specific starter kits as you need. MPS 150 is Ideal for a wide range of applications such as RF, mm-Wave and sub-THz characterization, FA, DWC, MEMS, optoelectronic tests and WL.
Summit 200 Probe Station
Designed for R&D, device characterization, modelling or niche production applications, the SUMMIT200 probe station enables precision electrical measurements over temperature for ultra-low noise, DC, RF, mmW and THz applications, with semi-automatic and now fully-automatic operation, for fastest time to accurate data.
CM300 Fully Automatic Probe Station
The CM300 series probe station meets the measurement challenges brought on by extremely complex environments, such as unattended testing on small pads over time and at multiple temperatures. Best-in-class measurement performance is achieved for a wide range of applications in an EMI-shielded, light-tight and moisture-free test environment.
With the material handling unit, the CM300xi probe station combines fully-automated wafer test with highest accuracy and flexibility. The system can handle up to fifty 200 or 300 mm wafers provided in SEMI-standard wafer cassettes.
FormFactor MPS150 Probe Station
Vacuum, Pressure and Cryo Probe Stations
FormFactor’s vacuum and pressure probe stations for on-wafer measurements in a high vacuum or controlled pressure environment enable precise µ-bolometer test (un-cooled IR-FPA), MEMS characterization (inertial MEMS, resonators and RF MEMS, pressure sensors), IV/CV, RF/mmW and Opto measurements. Multiple optical instruments like IR radiation sources (black bodies), and up to eight probe positioners and/or a probe card can be integrated.
FormFactor’s high-performance cryogenic probe stations support a wide range of challenging applications. Automatic chip alignment, OCR and wafer mark reading are exclusive features of fully- and semi-automated systems. Cooling options include liquid helium (LHe), liquid nitrogen (LN2) or cryogen-free cooling.
Visit our APPLICATION PAGE to find out more. Also on VIDEO.
PAV200 Semi-Automatic Vacuum Probe Station
The PAV200 is a highly-precise semi-automated probe station for wafers and substrates up to 200 mm in a vacuum environment down to < 1×10-4 mbar. Designed for industrial environments and major research facilities, it supports a wide range of applications, including DC and RF measurements, MEMS and optoelectronic tests.
PAP200 Semi-Automatic Vacuum and Pressure Probe Station
The PAP200 is a highly-precise semi-automated probing solution for wafers and substrates up to 200 mm in a vacuum environment down to < 1×10-5 mbar or in an overpressure environment up to 4.0 bar (abs.). Designed for industrial environments and major research facilities, it supports MEMS tests and a wide range of other applications.
IMS-K-Cryo-LFN Cryo Probe Station
High-performance cryogenic probe stations for on-wafer and multi-chip measurements support a wide range of challenging applications: IR-sensor test, radiometric test, DC and RF measurements at cryogenic temperatures. The systems can handle wafers up to 300 mm, and support cold filter, cold shutter and selectable f/value aperture as well as multiple optical instruments like IR radiation sources (black bodies).
PAC200 Fully-Automatic Cryogenic Probe Station
FormFactor Probes and Accessories
PicoTech offers the full range of probes and accesories for FormFactor Probe Stations including Single/Dual Channel RF probes, Mixed Signal RF and DC probes, High Performance DC probes, VNA Calibration Tools, different Microscopes, Positioners, Substrate Chucks, Vibration Isolation Tables, Shields, Enclosurers and many more.
Probe SELECTION GUIDE and Accessory CATALOGUE.
Single and Dual Channel RF Probes
Mixed SIgnal RF and DC Probes
High Performance DC Probes
DC, RF and Optical Probe Positioners
FormFactor offers a wide variety of manual and motorized probe positioners for any application from DC to terahertz measurements and beyond.
Engineered for high stability and accuracy, FormFactor‘s positioners enable precise, backlash-free and repeatable probe tip placements – from simple IV/CV measurements to highly challenging measurement tasks.
Tungsten Probes
Automated Probing with Summit 200 Probe Station
Autonomous Probing for Silicon Photonics, DC and RF
Autonomous Silicon Photonics Measurements
FormFactor’s Autonomous Silicon Photonics Measurement Assistant sets the industry-standard in wafer and die-level silicon photonics probing. This highly flexible solution provides a multitude of testing technologies from single fibers to arrays and from vertical coupling to edge coupling. With the new revolutionary OptoVue for advanced calibrations, intelligent machine vision algorithms and the exclusive SiPh TopHat for dark, shielded and frost-free environment, the system enables hands-free autonomous calibration and re-calibration at multiple temperatures. This enables faster time to more accurate measurements and reduced cost of test.
Autonomous DC Measurements
With FormFactor’s Contact Intelligence, the operator can start a test and leave the system measuring during the whole shift, overnight or even over the weekend, without any user intervention. Probes are dynamically corrected for the most accurate pad placement on-the-fly to compensate for any thermal expansion of the probes or device when changing temperature. Contact Intelligence modules enable complete hands-free 24/7 operation using motorized probe positioners for small pad touchdown optimization, automatic testing over multiple different temperatures, and automatic probe layout spacing for testing sub dies.
Perform True Autonomous RF and mm-Wave Measurements and Calibrations on 200mm and 300mm Probe Stations
FormFactor introduces a new assistant for autonomous calibration and measurement of RF devices over multiple temperatures. New RF devices for applications such as 5G, autonomous driving and next generation Wi-Fi, need to have the most accurate device models for their IC designs. Normal testing of RF device modelling test structures requires large amounts of time from the engineer to perform re-calibrations whenever the system drifts beyond a usable limit. Re-positioning of the probes when changing temperature, also requires user intervention.
Copyright © 2024 Picotech. All rights reserved.