Tescan SEMs, SEM Add-ons and Accessories
Wide Installed Base in Israel!
HR and UHR SEM, SEM-FIB, Compact SEM, 4D-STEM, Micro-CT
PicoTech offers a full range of Scanning Electron Microscopes by Tescan including HR and UHR SEM, SEM with Focused Ion Beam (FIB), compact SEM, revolutional 4D-STEM, Micro-CT.
Our SEMs can be also equipped with standard and customised add-ons and accessories by Imina, Nenovision, Alemnis, Bruker, Oxford, Agar, Kammrath & Weiss, NewTec and our other partners.
אודות החברה
פיקוטק היא חברת הנציגויות המובילה בתחום הציוד לתהליכי ייצור למוליכים למחצה, ננו-פבריקציה, מיקרוסקופיה אלקטרונית והרכבות מדוייקות. החברה מאופיינת בצוות מהנדסים מקצועי בעל ידע וניסיון רחבים, המתמחים במתן ייעוץ לפני רכישה ובליווי אחריה. בין לקוחותיה נמנים המפעלים הגדולים בארץ לייצור שבבים, חברות הזנק, חברות הרכבות אלקטרוניות, וכל מכוני המיקרו-אלקטרוניקה והננו-פבריקציה של האוניברסיטאות בישראל
Systems In Israel
In Semiconductors
In Israel
in Service in Israel
Tescan Magna UHR SEM for characterization of nanomaterials
Tescan Magna features the Triglav™ SEM column with immersion TriLens™ optics that offers a crossover-free electron beam and delivers excellent ultra-high resolution performance, especially at low electron beam energies. Triglav™ also includes a unique in-beam detection system with BSE energy filtering and angular selective BSE detection for improved materials contrast and enhanced surface sensitivity.
Visit our APPLICATION PAGE to find out more. Also on VIDEO.
Activated carbon – 500nm
Activated carbon doped with metallic nanoparticles visualized with In-Beam SE detector at an accelerated voltage of 2 keV.
Brain tissue – 2nm
Resin embedded brain tissue. The ultrastructure was visualized using In-Beam BSE detector at accelerating voltage of 2 keV.
Tescan corporate video
Best selling Tescan SEMs in Israel
With over 3000 SEMs all over the world, TESCAN is a leading global designer and manufacturer of scanning electron microscopes (SEM) and system solutions for different applications.
With a wide product range, TESCAN builds SEMs for any application need, from Tungsten Filament microscopes to high resolution field emission SEMs and Focused Ion Beam SEM.
Most popular Tescan SEM models are: Vega, Mira and Clara.
Visit our APPLICATION PAGE to find out more. Also on VIDEO.
Tescan Vega
VEGA 4th gen SEM with tungsten filament electron source combines SEM imaging and live elemental composition analysis in a single window of TESCAN’s Essence™ software. This simplifies acquisition of morphological and elemental data from the sample, making VEGA an efficient analytical solution for routine materials inspection in quality control, failure analysis and research labs.
Tescan Mira
MIRA 4th gen SEM with FEG Schottky electron emission source combines SEM imaging and live elemental composition analysis in a single window of TESCAN’s Essence™ software. This simplifies the acquisition of morphological and elemental data from the sample, making MIRA an efficient analytical solution for routine materials inspection in quality control, failure analysis and research labs.
Tescan Clara
CLARA is an Ultra High Resolution UHR-SEM with a Field Emission Gun electron source that allows to examine the microstructure, morphology and surface characteristics of biological and other samples across research fields. CLARA is suited for a variety of demanding SEM applications such as high resolution and low energy imaging, volume EM techniques, and is compatible with cryo workflows.
The most affordable Tescan SEM – Vega
What scientist doesn’t want his own SEM tool at his disposal for himself or students?
Now, this is possible, with Tescan’s Vega-4 series fully functional SEM, available within a very low budget. The fully customizable Vega SEM produces images with SEM magnifications continuously from x1 to x1,000,000 reaching resolutions down to 3nm.
Visit our APPLICATION PAGE to find out more. Also on VIDEO.
Wide-Field Mode™
Graphic card overview image captured using the Wide-Field Mode™ and Vega Compact SEM.
VEGA Compact SEM
Distribution of Si (blue), Cu (purple) and C (green) in ancient plaster identified by Essence™ EDS in the live scanning window of the VEGA Compact SEM.
VEGA for Materials Science
Fractured metal surface captured using SE detector at 5 keV accelerating voltage using Vega Compact SEM.
SEM add-ons and Accessories
SEM add-ons and Accessories
PicoTech offers the full range of add-ons and accesories for SEM microscopes including Nanopositioners for SEM, AFM in SEM, Alemnis ASA, Analytical tools like EDS, WDS, EBSD, BEX, Micro-XRF, SEM samples metal coaters, SEM filaments, Consumables kits for SEM and many more.
Our partners are: Imina, Nenovision, Alemnis, Bruker, Oxford, Agar, Kammrath & Weiss, NewTec and many others.
Nanopositioners
Up to 8 miBot™ nanoprobers can be delivered in various configurations and options to adapt to your specific application requirements and microscopy equipment. The compact and light platforms for the robots are compatible with any SEM and can either be mounted on the SEM sample positioning stage, or be loaded via the SEM load-lock.
AFM in SEM for 2D samples
AFM-in-SEM allows analysis by AFM (16 measurement modalities) and SEM, enabling complex surface characterization under in-situ vacuum conditions.
Topography and height profiling (AFM)
Mechanical properties (Phase imaging)
Electrical properties (C-AFM, KPFM)
Magnetic properties (MFM)
Chemical composition (EDX, SEM)
Alemnis Standard Assembly
The Alemnis Standard Assembly (ASA) is a modular indentation platform designed to be customized for your specific needs. Its unique modular design makes it the world’s most versatile, high performance and cost effective instrument and it is used in some of the most prestigious universities and research centers in the world.
EDS, WDS, EBSD, Micro-XRF
Bruker’s electron microscope analyzers EDS, WDS, EBSD and Micro-XRF on SEM offer the most comprehensive compositional and structural analysis of materials available today. The full integration of all these techniques into the ESPRIT software allows you to easily combine data obtained by these complementary methods for best results.
EDS, EBSD, BEX, WDS
Oxford Instruments NanoAnalysis provides leading-edge tools that enable materials characterisation and sample manipulation at the nanometre scale. Used on SEM, TEM and FIB, our tools are used for R&D across a wide range of academic and industrial applications including semiconductors, renewable energy, mining, metallurgy, and forensics.
Accessories for SEM
A leading international supplier of scientific instruments and accessories for over 40 years, Agar Scientific specialises in consumables and equipment supporting all forms of microscopy.
Agar Scientific offers SEM metal coaters, filaments, consumables kits for SEM and everything you might need for your SEM laboratory.
Insitu Tensile and Compression Modules
The Kammrath & Weiss Tensile & Compression Modules are the only ones on the market that can reach high loads of 5kN up to 10kN or even up to 15kN, while still fitting in every microsope chamber and be able to continuously pass through tensile, compression, and zero simultaneously.
FurnaSEM
FurnaSEM is a micro furnace (F = 50mm x 30mm) to qualify samples under optical microscopes and in-situ SEM (Scanning Electron Microscope), adapted to all SEM even on table.
Furnace internal specifications allows a use under high vacuum, low vacuum and with an environment controled by a gas injection (O2, H2O…) supplied optionnaly by Newtec.
Imina Nanoprobing for SEMs, Nenovision LiteScope AFM for SEMs
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