SAM, AFM, Nanoindentation

PicoTech offers various Scanning Acoustic Microscopes (SAM), Scanning Probe Microscopes (AFM) and Nanoindentation tools for R&D purposes and material science laboratory operation.

 

Typical applications are:

Quality Control, Defect Inspection, Material Properties, Topology Measurements, Elastic Modulus, Hardness, Yield Strength, Storage and Loss Moduli, Fracture Toughness, Scratch and Wear properties.