PicoTech offers a wide range of R&D table-top Spectroscopic Ellipsometers by Semilab.
Semilab’s R&D table-top spectroscopic ellipsometers provide modularity and high measurement performance in a compact table-top footprint. This cost-efficient tool includes manual goniometer and manual sample positioning suitable for R&D laboratories.
R&D table-top Spectroscopic Ellipsometers perform non-contact and non-destructive optical measurements on substrates, single layer and multi-layer samples to obtain individual thin film thickness and optical properties.
Measurement modes:
- Spectroscopic Ellipsometry with rotating compensator
- Generalized Ellipsometry for anisotropic samples
- Mueller matrix 11 coefficients
- Jones matrix
