Semi Metrology: CV/IV, Resistivity, Carrier Lifetime/Mobility

PicoTech offers various metrology tools for Material Characterization including CV/IV measurements and CV profiling, Contact and Non-Contact Resistivity Measurements and Mapping, Parallel Dipole Hall (PDL), Deep Level Transient Spectroscopy (DLTS), Minority Carrier Diffusion Length Measurements, Minority Carrier Lifetime Measurements, Non-Contact Carrier Mobility Measurements and others.