PicoTech offers a full range of Metrology Solutions and Analytical Tools by world leading manufacturers including: Tescan, Semilab, FormFactor, Polytec, XYZtec and others. Portfolio of machines includes manual, semi-automatic and fully automatic tools for the Semiconductor, PCB, General Electronics, R&D and other industries. Machines can accommodate samples from small pieces up to 300mm wafers.

The list of technologies includes:

Scanning Electron Microscopy (SEM), Focused Ion Beam SEM (FIB-SEM), Scanning Probe Microscopy (AFM), Nanoindentation, Spectroscopic Ellipsometry, Reflectometry, Porosimetry, Parallel Dipole Hall Measurements, Deep Level Transient Spectroscopy, Contact and Non-Contact C-V Profiling, Minority Carrier Diffusion Length Measurement, Minority Carrier Lifetime Measurement, Non-Contact Carrier Mobility Measurement, Contact and Contactless Resistivity Mapping, Sheet Resistance Measurements, Pull and Shear Testing for Die Attach and Wire Bonding, DC RF and Cryogenic Probestations, Laser Doppler Vibrometers, Failure Analysis Delayering, Ion Beam Etching with SIMS for Delayering and Reverse Engineering.