Contact 4PP 4 Point Probe Sheet Resistance Measurements

PicoTech offers Contact (4PP) 4 Point Probe Sheet Resistance Measurement tools for R&D labs and Universities. Different Probes are available with different needle radius and spacing. Different system types allow to measure wafers with manual mapping, samples with different heights.

 

Four Point Probe Sheet Resistance

The four point probe (4PP) is a widely used contact technique for monitoring of doping density, resistivity or emitter sheet resistance values. The separation of voltage and current electrodes eliminates the effect of contact resistance from the measurement result.