PicoTech offers Non-Contact Resistivity Mapping Systems for Semi-Insulators by Semilab.
Compound Material Characterization
Compound materials enable the production of advanced, easy-to-use power devices, ultra-high frequency radio devices and more. These emerging products become more and more prevalent in electric or hybrid cars for example, or in power management and distribution devices related to renewable energy sources. For reliable production, composition and defects, dopant concentration, electrical and optical qualities must be regularly monitored. Semilab offers several products for this purpose. Most products are non-contact and non-destructive, and in many cases, they reveal properties directly related to device characteristics or performance.
Non-Contact Resistivity Mapping for Semi-Insulators
Semilab’s Non-Contact Resistivity Mapping system is based on a contactless capacitance technique used for precise resistivity characterization of semi-insulating compound semiconductors over a wide resistivity range, useful for the device manufacturing industry.
Knowing the uniformity of resistivity and mobility values is critical to achieve process optimization. Mapping is critical for semi-insulating semiconductor QA processes as they show inhomogeneities that occur during manufacturing.
Application:
- Compound semiconductors: GaAs, SiC, GaN, CdTe, InP
- Resistivity measurement over a wide range: 1×105-1×1012 Ωcm
