PicoTech offers Parallel Dipole Hall (PDL) Measurement System by Semilab for Mapping of Resistance, Carrier Lifetime, Diffusion length and other parameters.
Parallel Dipole Hall Measurements
The PDL Hall system is capable of both AC and DC Hall measurement modes. The AC field measurement can be used for materials with the mobility of below 0.1 cm2/Vs, which is an advantage compared to the DC field measurement mode. Materials with such attributes are usually semiconductor, photovoltaic or thermoelectric materials.
High- Sensivity Parallel Dipole Hall Measurements
Hall measurement is one of the most important measurement for electronic materials & devices. However, Hall measurement of low mobility, very thin film (very high resistance) or very low resistance (e.g.: metal) is problematic or impossible due to very low signal to noise (S/N) ratio.
What could solve this research problem?
If you generate alternating (ac) magnetic field and perfom lock-in detection.
For this the parallel dipole line (PDL) system presents a novel magnetic trap system that demonstrates a unique “camelback field confinement” effect. It traps a diamagnetic object (e.g. graphite) at the center due to diamagnetic levitation effect.
By using such technology Semilab’s Parallel Dipole Line Hall Measurement System is able to measure sheet resistance, carrier concentration and mobility in wide ranges, with high sensitivity for R&D application.
