PicoTech offers Fully-Automatic Probe Stations by FormFactor.
Fully-Automatic Probe Stations, CM 300 Probe Station
The CM300 series probe station meets the measurement challenges brought on by extremely complex environments, such as unattended testing on small pads over time and at multiple temperatures. Best-in-class measurement performance is achieved for a wide range of applications in an EMI-shielded, light-tight and moisture-free test environment.
With the material handling unit, the CM300xi probe station combines fully-automated wafer test with highest accuracy and flexibility. The system can handle up to fifty 200 or 300mm wafers provided in SEMI-standard wafer cassettes.
