Scanning Acoustic Microscopy (SAM)

PicoTech offers a wide range of Scanning Acoustic Microscopes (SAM).

Compact table-top SAM’s and floor-standing SAM’s allow to work with samples from 350x180mm to 550x550mm in size. Many different transducers are available to fit any resolution requirements.

 

Typical applications are: Quality Control of Components, Defect Detection, Bumps, Flip-Chip, PCBa, ESC chucks, Materials Defect Control for Metals and Composites, and many others.

Semiconductor: BGA, QFT, TBGA, FBGA, SOP, FET, MLCC, PCB

Industrial: ITO Target, Wafer, Pipe, Plate, Bar, complex Material, Piston test, Flaw detection in Planting, Weld zone